NASA NTRS · 19670055901
Breakdown conduction in Al-SiO-Al capacitors.
Abstract
Destructive breakdown conduction in aluminum- silicon oxide-aluminum capacitors, discussing voltage threshold, etc
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Budenstein, P. P., Hayes, P. J.. 1967-06-01. Breakdown conduction in Al-SiO-Al capacitors.. https://ntrs.nasa.gov/citations/19670055901
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