Engineering topics
Publications and source records attributed to Chow, L. G..
Domain wall motion excited by slow rise-time, bipolar, hard-axis pulses in vacuum deposited CoNiFe films from 1500 to 2000 A thick is studied. The results are consistent with those of comparable NiFe films. Furthermore, the wall coercivity is found to be the most significant sample property correlated to the low-frequency creep properties of all the samples.
The results of an investigation of domain wall motion excited by slow rise-time, bipolar, hard-axis pulses in vacuum deposited CoNiFe films 1500A to 2000A thick are presented. The results are consistent with those of comparable NiFe films in spite of large differences in film properties. The present low frequency creep data together with previously published results in this and other laboratories can be accounted for by a model which requires that the wall structure change usually associated with low frequency creep be predominately a gyromagnetic process. The correctness of this model is reinforced by the observation that the wall coercive force, the planar wall mobility, and the occurrence of an abrupt wall structure change are the only properties closely correlated to the creep displacement characteristics of a planar wall in low dispersion films.
Evaporated Permalloy films deposition temperature measurement by vacuum evaporated Chromel- constantan thin film thermocouple, noting temperature difference between film and glass substrate