NASA NTRS · 19730034560
Low-frequency creep in CoNiFe films.
Abstract
Domain wall motion excited by slow rise-time, bipolar, hard-axis pulses in vacuum deposited CoNiFe films from 1500 to 2000 A thick is studied. The results are consistent with those of comparable NiFe films. Furthermore, the wall coercivity is found to be the most significant sample property correlated to the low-frequency creep properties of all the samples.
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Bartran, D. S., Bourne, H. C., Jr., Chow, L. G.. 1972-09-01. Low-frequency creep in CoNiFe films.. https://ntrs.nasa.gov/citations/19730034560
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