Advances in Reliability Monitoring and Failure Analysis in 3D Microsystems
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Jordan, Matthew↗
Engineering topics
Christiansen, Joel Timothy
Publications and source records attributed to Christiansen, Joel Timothy.
Heterogeneous Integrated Failure Analysis Using Radio Frequency Signal Detection/Injection with Power Spectrum Analysis
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Christiansen, Joel Timothy↗
Heterogeneous Integrated Failure Analysis Using RF Signal Detection/Injection with Power Spectrum Analysis
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Christiansen, Joel Timothy↗
Automated Algorithms for Screening Electronic Parts for Aging using Power Spectra Analysis (PSA) Data
Previously reviewed presentation SAND2024-09493C with audio added
Multari, Rosalie A↗
Automated Algorithms for Screening Electronic Parts for Aging using Power Spectra Analysis (PSA) Data
Understanding the age of semiconductor parts being built into devices and systems is of interest for manufacturing quality control. Power spectrum analysis (PSA) is a fast, non-destructive, sensitive method for examining semiconductor parts. This talk will cover the use of multivariate analysis on both PSA data and conventional current-voltage data generated prior to PSA analysis to create algorithms that can be automated to screen semiconductor parts for aging.
Multari, Rosalie A↗