DOE OSTI · 2585991
Automated Algorithms for Screening Electronic Parts for Aging using Power Spectra Analysis (PSA) Data
Abstract
Understanding the age of semiconductor parts being built into devices and systems is of interest for manufacturing quality control. Power spectrum analysis (PSA) is a fast, non-destructive, sensitive method for examining semiconductor parts. This talk will cover the use of multivariate analysis on both PSA data and conventional current-voltage data generated prior to PSA analysis to create algorithms that can be automated to screen semiconductor parts for aging.
Keep this discovery
Explore connections, maps & timelines
Multari, Rosalie A, DeJong, Stephanie, Carnali, Abigail Elizabeth, Christiansen, Joel Timothy, Carilli, Kelsey Monique. 2024-09-01. Automated Algorithms for Screening Electronic Parts for Aging using Power Spectra Analysis (PSA) Data. https://doi.org/10.2172/2585991
Cite the original work for its findings. Save a collection to share your selection of sources.