Automated Algorithms for Screening Electronic Parts for Aging using Power Spectra Analysis (PSA) Data
Previously reviewed presentation SAND2024-09493C with audio added
Multari, Rosalie A↗
Engineering topics
Publications and source records attributed to Multari, Rosalie A.
Previously reviewed presentation SAND2024-09493C with audio added
Understanding the age of semiconductor parts being built into devices and systems is of interest for manufacturing quality control. Power spectrum analysis (PSA) is a fast, non-destructive, sensitive method for examining semiconductor parts. This talk will cover the use of multivariate analysis on both PSA data and conventional current-voltage data generated prior to PSA analysis to create algorithms that can be automated to screen semiconductor parts for aging.