Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits.
Abstract not provided.
Spear, Matthew↗
Engineering topics
Clark, Lawrence
Publications and source records attributed to Clark, Lawrence.
Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits.
Abstract not provided.
Spear, Matthew↗
A Soft-Error Hardened by Design MicroprocessorImplemented in Bulk 12-nm FINFET CMOS.
Abstract not provided.
Clark, Lawrence↗