DOE OSTI · 1899521
A Soft-Error Hardened by Design MicroprocessorImplemented in Bulk 12-nm FINFET CMOS.
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Clark, Lawrence, Duvnjak, Alen, Brunhaver, John, Agarwal, Sapan, Manuel, Jack, Cannon, Matthew, Marinella, Matthew. 2021-11-01. A Soft-Error Hardened by Design MicroprocessorImplemented in Bulk 12-nm FINFET CMOS.. https://doi.org/10.2172/1899521
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