Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits.
Abstract not provided.
Spear, Matthew↗
Engineering topics
Manuel, Jack
Publications and source records attributed to Manuel, Jack.
Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits.
Abstract not provided.
Spear, Matthew↗
Single Event Upset Response of 12L FinFET Digital Circuits.
Abstract not provided.
Neuendank, Jereme x↗
Total ionizing dose and single event effects on 12-nm bulk FinFETs.
Abstract not provided.
Wilson, Donald↗
A Soft-Error Hardened by Design MicroprocessorImplemented in Bulk 12-nm FINFET CMOS.
Abstract not provided.
Clark, Lawrence↗
Exploration of synergistic behavior of operational amplifiers in combined ion and electron environments.
Abstract not provided.
Young, Joshua↗
Investigation of Total Ionizing Dose on Domain-wall Magnetic Tunnel Junction Logic Devices (Presentation).
Abstract not provided.
Bennett, Christopher H↗