Engineering topics

Frey, Bradley

Publications and source records attributed to Frey, Bradley.

4 records

NASA NTRS2007

An Overview of Integration and Test of the James Webb Space Telescope Integrated Science Instrument Module

The James Webb Space Telescope (JWST) is a 6.6m diameter, segmented, deployable telescope for cryogenic IR space astronomy (approx.40K). The JWST Observatory architecture includes the Optical Telescope Element (OTE) and the Integrated Science Instrument Module (ISIM) element that contains four science instruments (SI) including a Guider. The SIs and Guider are mounted to a composite metering structure with outer dimensions of 2.1x2.2x1.9m. The SI and Guider units are integrated to the ISIM structure and optically tested at NASA/Goddard Space Flight Center as an instrument suite using a high-fidelity, cryogenic JWST telescope simulator that features a 1.5m diameter powered mirror. The SIs are integrated and aligned to the structure under ambient, clean room conditions. SI performance, including focus, pupil shear and wavefront error, is evaluated at the operating temperature. We present an overview of the ISIM integration within the context of Observatory-level construction. We describe the integration and verification plan for the ISIM element, including an overview of our incremental verification approach, ambient mechanical integration and test plans and optical alignment and cryogenic test plans. We describe key ground support equipment and facilities.

Drury, Michael↗

NASA NTRS2005

High Accuracy, Absolute, Cryogenic Refractive Index Measurements of Infrared Lens Materials for JWST NIRCam using CHARMS

The current refractive optical design of the James Webb Space Telescope (JWST) Near Infrared Camera (NIRCam) uses three infrared materials in its lenses: LiF, BaF2, and ZnSe. In order to provide the instrument s optical designers with accurate, heretofore unavailable data for absolute refractive index based on actual cryogenic measurements, two prismatic samples of each material were measured using the cryogenic, high accuracy, refraction measuring system (CHARMS) at NASA GSFC, densely covering the temperature range from 15 to 320 K and wavelength range from 0.4 to 5.6 microns. Measurement methods are discussed and graphical and tabulated data for absolute refractive index, dispersion, and thermo-optic coefficient for these three materials are presented along with estimates of uncertainty. Coefficients for second order polynomial fits of measured index to temperature are provided for many wavelengths to allow accurate interpolation of index to other wavelengths and temperatures.

Leviton, Douglas↗

NASA NTRS2005

Automation, Operation, and Data Analysis in the Cryogenic, High Accuracy, Refraction Measuring System (CHARMS)

The Cryogenic High Accuracy Refraction Measuring System (CHARMS) at NASA s Goddard Space Flight Center has been enhanced in a number of ways in the last year to allow the system to accurately collect refracted beam deviation readings automatically over a range of temperatures from 15 K to well beyond room temperature with high sampling density in both wavelength and temperature. The engineering details which make this possible are presented. The methods by which the most accurate angular measurements are made and the corresponding data reduction methods used to reduce thousands of observed angles to a handful of refractive index values are also discussed.

Frey, Bradley↗

NASA NTRS2004

CHARMS: The Cryogenic, High-Accuracy Refraction Measuring System

The success of numerous upcoming NASA infrared (IR) missions will rely critically on accurate knowledge of the IR refractive indices of their constituent optical components at design operating temperatures. To satisfy the demand for such data, we have built a Cryogenic, High-Accuracy Refraction Measuring System (CHARMS), which, for typical 1R materials. can measure the index of refraction accurate to (+ or -) 5 x 10sup -3 . This versatile, one-of-a-kind facility can also measure refractive index over a wide range of wavelengths, from 0.105 um in the far-ultraviolet to 6 um in the IR, and over a wide range of temperatures, from 10 K to 100 degrees C, all with comparable accuracies. We first summarize the technical challenges we faced and engineering solutions we developed during the construction of CHARMS. Next we present our "first light," index of refraction data for fused silica and compare our data to previously published results.

Frey, Bradley↗