CHARMS: The Cryogenic, High-Accuracy Refraction Measuring System

Abstract

The success of numerous upcoming NASA infrared (IR) missions will rely critically on accurate knowledge of the IR refractive indices of their constituent optical components at design operating temperatures. To satisfy the demand for such data, we have built a Cryogenic, High-Accuracy Refraction Measuring System (CHARMS), which, for typical 1R materials. can measure the index of refraction accurate to (+ or -) 5 x 10sup -3 . This versatile, one-of-a-kind facility can also measure refractive index over a wide range of wavelengths, from 0.105 um in the far-ultraviolet to 6 um in the IR, and over a wide range of temperatures, from 10 K to 100 degrees C, all with comparable accuracies. We first summarize the technical challenges we faced and engineering solutions we developed during the construction of CHARMS. Next we present our "first light," index of refraction data for fused silica and compare our data to previously published results.