Enhanced Robustness of Atomic Precision Devices under Accelerated Lifetime Testing
Presentation at MRS2023 Spring meeting on APAM robustness topic from FAIR DEAL GC.
Ivie, Jeffrey Andrew↗
Engineering topics
Halsey, Connor
Publications and source records attributed to Halsey, Connor.
Direct Integration of Atomic Precision Devices into a MOS-Compatible Process.
Abstract not provided.
Ivie, Jeffrey↗