Engineering topics
Publications and source records attributed to Hamiter, L..
The current reliability problems related to electronic components and microcircuits are presented in this paper. Specific process controls, design, materials, application constraints, destructive testing, electrical tests, and procedures for implementation are recommended to improve the reliability of selected electronic components.
Infrared microscope instrument measures and plots the infrared profile of semiconductor chips, transistors and integrated circuits. Infrared analyses yields information on electrical and physical properties, enabling manufacturing improvements in semiconductor performance and reliability. Operational performance and main sections of the instrument are given.
LSI circuits in space electronics, discussing packaging, reliability, applications, etc
IR techniques for reliability enhancement of microelectronics
Fast scanning IR microscope for semiconductor evaluation used for engineering design analysis, reliability improvement, failure analysis, etc