NASA NTRS · 19720053436
Survey of current component reliability problems and methods for prevention.
Abstract
The current reliability problems related to electronic components and microcircuits are presented in this paper. Specific process controls, design, materials, application constraints, destructive testing, electrical tests, and procedures for implementation are recommended to improve the reliability of selected electronic components.
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Hamiter, L., Villella, F.. 1972-01-01. Survey of current component reliability problems and methods for prevention.. https://ntrs.nasa.gov/citations/19720053436
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