Engineering topics
Publications and source records attributed to Irwin, Tim.
We present radiation data, Total Ionizing Dose and Single Event Effects, on the LSI Logic 0.11 micron commercial process and two modified versions of this process. Modified versions include a buried layer to guarantee Single Event Latchup immunity.
Susceptibility of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include digital, linear bipolar, and hybrid devices.
Vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include digital, linear bipolar, and hybrid devices.