NASA NTRS · 20050210237
Recent Single Event Effects Results for Candidate Spacecraft Electronics for NASA
Abstract
Vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include digital, linear bipolar, and hybrid devices.
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O'Bryan, Martha V., LaBel, Kenneth A., Ladbury, Ray L., Howard, James W., Jr., Kniffin, Scott D., Forney, James D., Irwin, Tim, Kim, H., Buchner, Stephen P., Oldham, Timothy R.. 2005-01-01. Recent Single Event Effects Results for Candidate Spacecraft Electronics for NASA. https://ntrs.nasa.gov/citations/20050210237
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