Engineering topics

James D. Forney

Publications and source records attributed to James D. Forney.

4 records

NASA NTRS2023

Single-Event Effect Testing of the Analog Devices AD8041ARZ Operational Amplifier

This study was undertaken to determine the single event transient distribution of a transimpedance amplifier configuration of the AD8041 Operational Amplifier. The AD8041 is made in a bipolar technology and the application of interest has a bipolar supply of ±5 V. The device was monitored for transient events on the output voltage during exposure to a heavy ion beam at Lawrence Berkeley National Laboratory’s (LBNL) 88-inch Cyclotron.

Matthew B. Joplin↗

NASA NTRS2022

Total Ionizing Dose Test Report for the AD581 Precision Voltage Reference

The purpose of this test was to determine the low dose rate total ionizing dose susceptibility of the AD581 precision voltage reference, for the Joint Polar Satellite System (JPSS) Program.

Dakai Chen↗

NASA NTRS2020

NASA Goddard Space Flight Center’s Compendium of Radiation Effects Test Results

Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FETs, flash memory, FPGAs, optoelectronics, digital, analog, and bipolar devices.

Single Event Effects (SEE)↗

NASA NTRS2001

Recent Radiation Damage and Single Event Effect Results for Candidate Spacecraft Electronics

We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy-ion induced single-event effects and proton-induced damage. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), and DC-DC converters, among others.

Martha V. OBryan↗