NASA NTRS · 20010069516
Recent Radiation Damage and Single Event Effect Results for Candidate Spacecraft Electronics
Abstract
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy-ion induced single-event effects and proton-induced damage. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), and DC-DC converters, among others.
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Martha V. OBryan, Kenneth A Label, Robert A. Reed, Ray L. Ladbury, James W. Howard, Jr., Stephen P. Buchner, Janet L. Barth, Scott D. Kniffen, Christina M. Seidleck, Cheryl J. Marshall, Paul W. Marshall, Hak S.Kim, Donald K. Hawkins, Martin A. Carts, James D. Forney, Anthony B. Sanders, Stephen R. Cox, Curtis J. Dunsmore, Christopher Palor, John H. Day. 2001-01-01. Recent Radiation Damage and Single Event Effect Results for Candidate Spacecraft Electronics. https://ntrs.nasa.gov/citations/20010069516
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