Engineering topics
Publications and source records attributed to Stephen R. Cox.
The purpose of this test was to determine the low dose rate total ionizing dose susceptibility of the AD581 precision voltage reference, for the Joint Polar Satellite System (JPSS) Program.
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy-ion induced single-event effects and proton-induced damage. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), and DC-DC converters, among others.