Engineering topics

Jason Osheroff

Publications and source records attributed to Jason Osheroff.

11 records

All sources NASA NTRS DOE OSTI

NASA NTRS2023

Translating and Supplementing Si Based Radiation Effects Knowledge to the Wide Band-Gap Devices of Tomorrow’s Space Flight Missions

Explore the source record for details and available documents.

Jason Osheroff↗

NASA NTRS2022

Wide Band-Gap (WBG) and Power Device Testing Update 2022

Explore the source record for details and available documents.

Jason Osheroff↗

NASA NTRS2021

Proton Recoils in GaN & Upcoming RF GaN Work

Explore the source record for details and available documents.

Gallium Nitride (GaN)↗

NASA NTRS2021

Total Ionizing Dose Test Report MAX4651 Quad SPST Analog Switch

The purpose of this testing was to perform a Radiation Lot Acceptance Test (RLAT) for Total Ionizing Dose (TID) of MAX4651 Low-Voltage, 4Ω, Quad, SPST, CMOS Analog Switches for the Roman Space Telescope (RST).

total ionizing dose (TID)↗

NASA NTRS2020

U309 N-Channel Silicon Junction Field Effect Transistor Total Ionizing Dose Characterization Report

The purpose of this testing was to characterize the InterFET Corporation U309 for total dose response. This test shall serve as the radiation lot acceptance test (RLAT) for the lot date code (LDC) tested. The U309 is a discrete Junction Field Effect Transistor (JFET). High dose rate (HDR) irradiations were performed in this test so that the device susceptibility to Total Ionizing Dose (TID) could be determined.

Total Ionizing Dose (TID)↗

NASA NTRS2020

Update on Wide Bandgap (WBG) Device Radiation Hardness Assurance

This presentation provides an overview of recent wide bandgap device radiation hardness assurance activities at NASA and via NASA-funded grant vehicles. Devices include enhancement mode power GaN HEMTs, RF GaN HEMTs, and SiC MOSFETs and JBS diodes.

wide bandgap↗

NASA NTRSDate not supplied