A quantitative structural characterisation of active semiconducting materials (mSi; SiO[subscript 2]; Al[subscript 2]O[subscript 3]; TiO[subscript 2]) for use in printed electronics using a combination of Small Angle Light Scattering (SALS) and Ultra Small Angle X-ray Scattering (USAXS)
Abstract not provided
Setshedi, Rhyme↗