Single-Event Effects Test Report Texas Instruments, OPA847 Ultra-Low Noise Operational Amplifier
Explore the source record for details and available documents.
Kaitlyn L Ryder↗
Engineering topics
Jonathan D Barth
Publications and source records attributed to Jonathan D Barth.
Single-Event Effects Test Report Texas Instruments, OPA856 Low-Noise Operational Amplifier
Explore the source record for details and available documents.
Kaitlyn L Ryder↗
Single-Event Effects Test Report Texas Instruments, OPA691 Current Feedback Operational Amplifier
Testing was done to characterize the Texas Instruments Operational Amplifiers OPA691 single event effects (SEE) response. The primary SEE concerns for this device are single event latchup (SEL) and single event transients (SETs). Testing focused on determining susceptibility to SEL and characterizing the SET response. Testing occurred on November 11, 2022.
Kaitlyn L Ryder↗
Single-Event Effects Test Report Texas Instruments, OPA842 Low-Noise Operational Amplifier
Testing was done to characterize the Texas Instruments Operational Amplifiers OPA842 single event effects (SEE) response. The primary SEE concerns for this device are single event latchup (SEL) and single event transients (SETs). Testing focused on determining susceptibility to SEL and characterizing the SET response. Testing occurred on November 11, 2022.
Kaitlyn L Ryder↗
Single-Event Effects Test Report Texas Instruments, OPA855 Low-Noise Operational Amplifier
Explore the source record for details and available documents.
Kaitlyn L Ryder↗
NASA Goddard Space Flight Center’s Recent Radiation Effects Test Results
Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FPGAs, optoelectronics, digital, analog, and bipolar devices.
Alyson D Topper↗
Statistical Analysis of Historical SEL Test Data to Provide a Priori Risk Estimates for Use of Unhardened CMOS Parts
We develop guidelines for a priori assessment of risk due to potentially SEL susceptible parts by exploratory analysis of large datasets of SEL test data for unhardened CMOS parts.
Ray Ladbury↗