NASA NTRS · 20230009770
Single-Event Effects Test Report Texas Instruments, OPA842 Low-Noise Operational Amplifier
Abstract
Testing was done to characterize the Texas Instruments Operational Amplifiers OPA842 single event effects (SEE) response. The primary SEE concerns for this device are single event latchup (SEL) and single event transients (SETs). Testing focused on determining susceptibility to SEL and characterizing the SET response. Testing occurred on November 11, 2022.
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Kaitlyn L Ryder, Jonathan D Barth, Michael J Campola, Matthew B Joplin, Thomas A Carstens, Richard J Hare. 2022-11-01. Single-Event Effects Test Report Texas Instruments, OPA842 Low-Noise Operational Amplifier. https://ntrs.nasa.gov/citations/20230009770
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