Single-Event Effects Test Report Texas Instruments, OPA847 Ultra-Low Noise Operational Amplifier
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Kaitlyn L Ryder↗
Engineering topics
Richard J Hare
Publications and source records attributed to Richard J Hare.
Single-Event Effects Test Report Texas Instruments, OPA856 Low-Noise Operational Amplifier
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Kaitlyn L Ryder↗
Single-Event Effects Test Report Texas Instruments, OPA691 Current Feedback Operational Amplifier
Testing was done to characterize the Texas Instruments Operational Amplifiers OPA691 single event effects (SEE) response. The primary SEE concerns for this device are single event latchup (SEL) and single event transients (SETs). Testing focused on determining susceptibility to SEL and characterizing the SET response. Testing occurred on November 11, 2022.
Kaitlyn L Ryder↗
Single-Event Effects Test Report Texas Instruments, OPA842 Low-Noise Operational Amplifier
Testing was done to characterize the Texas Instruments Operational Amplifiers OPA842 single event effects (SEE) response. The primary SEE concerns for this device are single event latchup (SEL) and single event transients (SETs). Testing focused on determining susceptibility to SEL and characterizing the SET response. Testing occurred on November 11, 2022.
Kaitlyn L Ryder↗
Single-Event Effects Test Report Texas Instruments, OPA855 Low-Noise Operational Amplifier
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Kaitlyn L Ryder↗