Engineering topics
Publications and source records attributed to Kaitlyn L. Ryder.
We present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to heavy ion and proton induced single-event effects (SEE), proton-induced displacement damage dose (DDD), and total ionizing dose (TID).
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We present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to heavy ion and proton induced single event effects (SEE), proton-induced displacement damage dose (DDD), and total ionizing dose (TID).
Heavy ion-, focused X ray-, and pulsed laser induced single event effects in an epitaxial silicon diode were simulated using Sentaurus Technology Computer Aided Design (TCAD). The variation of the potential with time in simulation agrees with previous experimental data, which suggests that the different radiation sources result in different amounts of potential modulation. The charge generation spatial profile strongly affects the potential modulation. The longitudinal range and starting location of generated charge most strongly impacts the amount of potential modulation, while the radial width has a slight effect, and the temporal duration of charge injection has negligible impact on potential modulation
The purpose of this testing was to obtain sample pulsed-laser-induced single event transients (SETs) of the Analog Devices AD620 Instrumentation Amplifier. The test was conducted at the Naval Research Laboratory using their two-photon absorption (TPA) laser.
The purpose of this testing was to characterize the pulsed-laser-induced single event effect (SEE) susceptibility of the Texas Instruments LM7171 voltage feedback amplifier. The test was conducted at the Naval Research Laboratory using their two-photon absorption (TPA) laser.
SEAM is a useful resource for model-based radiation hardness assurance but can be technically challenging for new users. R-Gentic is a NASA developed website that aims at assisting engineers better understand the radiation concerns in their EEE parts. This work aims at providing an update on an ongoing effort to interface R-Gentic with SEAM. Once integration is completed, R-Gentic can be used to seed new SEAM projects, making project creation easier and more accessible.
Radiation vulnerability assessment early in spacecraft development is cheaper and faster than in late development phases. RGENTIC and SEAM are two software platforms that can be coupled to provide this type of early assessment. Specifically, RGENTIC is a tool that outputs descriptions of radiation risks based on a selected mission environment and the system’s electronic part portfolio, while SEAM models how radiation-induced faults in electronic parts propagate through a system. In this work, we propose a spacecraft evaluation flow where RGENTIC’s outputs, which are radiation vulnerabilities of electronic parts for a given mission, become inputs to SEAM, resulting in an automatic part-type template palette presented to users so that they can easily begin modeling the occurrence and propagation of radiation-induced faults in their spacecraft. In this context, fault propagation modeling shows how radiation effects impact the spacecraft’s electronics.
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