NASA NTRS · 20210026449
Texas Instruments LM7171 Voltage Feedback Amplifier Laser Single-Event Effects Characterization Test Report
Abstract
The purpose of this testing was to characterize the pulsed-laser-induced single event effect (SEE) susceptibility of the Texas Instruments LM7171 voltage feedback amplifier. The test was conducted at the Naval Research Laboratory using their two-photon absorption (TPA) laser.
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Kaitlyn L. Ryder, Anthony M. Phan, Michael J. Campola, Ani Khachatrian, Dale P. McMorrow, Adrian Ildefonso. 2018-07-27. Texas Instruments LM7171 Voltage Feedback Amplifier Laser Single-Event Effects Characterization Test Report. https://ntrs.nasa.gov/citations/20210026449
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