Total Ionizing Dose Effect Study on Radiation-Hard Power MOSFET Device.
Abstract not provided.
Kerber, Pranita↗
Engineering topics
Kerber, Pranita
Publications and source records attributed to Kerber, Pranita.
Heavy Ion Displacement Damage Effects in 14nm-Process FinFETs.
Abstract not provided.
Esposito, Madeline G.↗