DOE OSTI · 1772208
Total Ionizing Dose Effect Study on Radiation-Hard Power MOSFET Device.
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Kerber, Pranita, Leeson, Kenneth Michael, Gao, Xujiao, Musson, Lawrence, Campbell, Philip, McLain, Michael Lee, Paskaleva, Biliana Stefanova, Mar, Alan. 2020-03-01. Total Ionizing Dose Effect Study on Radiation-Hard Power MOSFET Device.. https://www.osti.gov/biblio/1772208
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