Engineering topics
Publications and source records attributed to Kowitz, H. R..
New instrument gives quantitive information on "excess noise" in semiconductor-diode laser (SDL's). By proper selection of detector, instrument tests any SDL from visible wavelengths through thermal infrared. Lasers determine excess noise in SKL source by measuring photocurrent generated in photodetector exposed first to reference laser then to SKL under test.
A comparison of measured and predicted signal-to-noise ratio is made in an optical heterodyne spectrometer utilizing a tunable diode laser which exhibited excess noise. It is shown that good agreement between predicted and measured signal-to-noise ratios results if excess noise effects due to tunable diode lasers are included in the predictions. The methods used to quantify excess noise and to incorporate their effects into predictions of signal-to-noise ratio are discussed.
Photodiodes used as photomixers in heterodyne applications display quantum efficiencies that are lower than the dc quantum efficiency of the device. Measurement techniques used to obtain dc quantum efficiencies, midband heterodyne quantum efficiencies, and frequency roll off characteristics are described. Measurement results for two HgCdTe photodiodes are given and discussed. It is recommended that photodiodes used in heterodyne applications be tested for heterodyne quantum efficiency over the frequency band of interest for the particular application.
The use of photodiodes as optical photomixers in laser heterodyne spectroscopy systems is discussed. The quantum efficiency of the photodiodes is reported with the emphasis on its effect on the system's signal to noise ratio. The measurement techniques used to determine photodiode dc and heterodyne quantum efficiencies are described. The theory behind the measurements as well as actual measurements data for two HgCdTe photodiodes are presented.