NASA NTRS · 19830000004
Measuring Excess Noise in SDL's
Abstract
New instrument gives quantitive information on "excess noise" in semiconductor-diode laser (SDL's). By proper selection of detector, instrument tests any SDL from visible wavelengths through thermal infrared. Lasers determine excess noise in SKL source by measuring photocurrent generated in photodetector exposed first to reference laser then to SKL under test.
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Katzberg, S. J., Kowitz, H. R., Rowland, C. W., Shull, T. A., Ruggles, S. L., Matthews, L. F.. 1983-08-01. Measuring Excess Noise in SDL's. https://ntrs.nasa.gov/citations/19830000004
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