Engineering topics
Publications and source records attributed to Krieger, Allen S..
We have measured the diffraction peak of a W:Si synthetic multilayer reflector at 104 keV using the High Energy Bonse-Hart Camera at the X-17B hard X-ray wiggler beam line of the National Synchrotron Light Source at Brookhaven National Laboratory. The characteristics of the diffraction peak are described and compared to theory.
The design, fabrication, and test performance of a grazing-incidence diverging magnifier (GIDM) for use in high-resolution X-ray imaging of the solar corona are described. The GIDM, designed to be mounted in front of the focus of a 30.48-cm Wolter-Schwarzschild primary, is an Ni-coated Be hyperboloid-hyperboloid structure of principal diameter 3.15 cm; the two components are mounted on a central steel plate which acts as a support and spacer. The combined instrument has overall length 1.9 m, effective focal length 5.4 m, and plate scale 26.0 micron/arcsec. In point- and line-source measurements in an 89.5-m vacuum test facility, the on-axis resolution is shown to be equal to that of the primary alone. The field of view for 1-arcsec resolution is limited to 1.25 arcmin in radius, but the effective-area limitation is less significant when CCD detectors of high quantum efficiency are used instead of film.