NASA NTRS · 19930055634
Multilayer diffraction at 104 keV
Abstract
We have measured the diffraction peak of a W:Si synthetic multilayer reflector at 104 keV using the High Energy Bonse-Hart Camera at the X-17B hard X-ray wiggler beam line of the National Synchrotron Light Source at Brookhaven National Laboratory. The characteristics of the diffraction peak are described and compared to theory.
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Krieger, Allen S., Blake, Richard L., Siddons, D. P.. 1993-01-01. Multilayer diffraction at 104 keV. https://ntrs.nasa.gov/citations/19930055634
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