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Lave, H.

Publications and source records attributed to Lave, H..

Optical monitoring system

Instrument can measure optical transmission, reflectance, and scattering. This information can be used to identify changes in optical properties or deviations from required optical standards. Device consists of monochromatic source, photo detector, transfer mirror, and hemiellipsoid. System might be used to measure optical properties of thin film.

Nev, J. T.↗