NASA NTRS · 19730000050
Optical monitoring system
Abstract
Instrument can measure optical transmission, reflectance, and scattering. This information can be used to identify changes in optical properties or deviations from required optical standards. Device consists of monochromatic source, photo detector, transfer mirror, and hemiellipsoid. System might be used to measure optical properties of thin film.
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Nev, J. T., Wrench, E. H., Fox, M. G., Lave, H.. 1973-02-01. Optical monitoring system. https://ntrs.nasa.gov/citations/19730000050
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