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Lee, L. D.

Publications and source records attributed to Lee, L. D..

Reliability bounds for fault-tolerant systems with competing responses to component failures

Bounds are established on the probability of system failure for fault-tolerant systems of the type used, for example, in aviation control. Event series leading to system failure are assumed to follow a semi-Markov model in which the potential sojourn times associated with component failures have exponential distributions and those associated with system responses have distributions with unspecified form. A product form of the bounds is derived by using a model that provides for multiple competing system responses to component failures.

Lee, L. D.

A theoretical basis for the analysis of multiversion software subject to coincident errors

Fundamental to the development of redundant software techniques (known as fault-tolerant software) is an understanding of the impact of multiple joint occurrences of errors, referred to here as coincident errors. A theoretical basis for the study of redundant software is developed which: (1) provides a probabilistic framework for empirically evaluating the effectiveness of a general multiversion strategy when component versions are subject to coincident errors, and (2) permits an analytical study of the effects of these errors. An intensity function, called the intensity of coincident errors, has a central role in this analysis. This function describes the propensity of programmers to introduce design faults in such a way that software components fail together when executing in the application environment. A condition under which a multiversion system is a better strategy than relying on a single version is given.

Eckhardt, D. E., Jr.

Reliability bounds for fault-tolerant systems with competing responses to component failures

Bounds are established on the probability of system failure for fault-tolerant systems of the type used, for example, in aviation control. Event series leading to system failure are assumed to follow a semi-Markov model in which the potential sojourn times associated with component failures have exponential distributions and those associated with system responses have distributions with unspecified form. A product form of the bounds is derived by using a model that provides for multiple competing system responses to component failures.

Lee, L. D.

A theoretical basis for the analysis of redundant software subject to coincident errors

Fundamental to the development of redundant software techniques fault-tolerant software, is an understanding of the impact of multiple-joint occurrences of coincident errors. A theoretical basis for the study of redundant software is developed which provides a probabilistic framework for empirically evaluating the effectiveness of the general (N-Version) strategy when component versions are subject to coincident errors, and permits an analytical study of the effects of these errors. The basic assumptions of the model are: (1) independently designed software components are chosen in a random sample; and (2) in the user environment, the system is required to execute on a stationary input series. The intensity of coincident errors, has a central role in the model. This function describes the propensity to introduce design faults in such a way that software components fail together when executing in the user environment. The model is used to give conditions under which an N-Version system is a better strategy for reducing system failure probability than relying on a single version of software. A condition which limits the effectiveness of a fault-tolerant strategy is studied, and it is posted whether system failure probability varies monotonically with increasing N or whether an optimal choice of N exists.

Eckhardt, D. E., Jr.

An analysis of the effects of coincident errors on multi-version software

The present study is concerned with the application of a model which provides a basis for analytical investigations of redundant software. The model links certain basic quantities with the experimental process of testing independently designed software components. The model is employed to provide insight into the effects of coincident errors on an N-version software structure in which the structure fails if at least a majority of its components fail. Attention is given to coincident errors, the intensity distribution for coincident errors, the coincident errors model, and a condition for redundancy to improve reliability.

Eckhardt, D. E., Jr.

Statistical analysis of direct-strike lightning data (1980 to 1982)

Electromagnetic measurements are being made during direct lightning strikes by NASA Langley Center using a specially instrumented F-106B aircraft. The research is to aid refinement, characterization, and understanding of the lightning-aircraft interaction process and the lightning hazards to aircraft. Statistical methods are applied to characterize some aspects of the lightning data obtained from 176 strikes to the aircraft. Specific attention is given to the problem of estimating the upper extreme quantiles of the distributions of peak-to-peak values for currents and rates of change in the magnetic and flux densities. A formal treatment via a general location-scale family of models allows the estimation method to be adapted to the realized shapes the distributions. The shapes are examined by probability plotting methods.

Lee, L. D.

Some methods of estimating a coverage parameter

To demonstrate the high reliability of fault-tolerant computing systems, experimental testing can be performed by injecting faults into their hardware and observing the times needed to detect and isolate failed components and reconfigure the good components. Coverage, a parameter measuring continued system success, is the probability that recovery occurs before other, perhaps catastrophic, component failures occur. Methods of estimating coverage are given for the case of randomly selecting a subset of the pins or chips for testing. Pin-level samples of times to recovery are treated by the Type I censoring model often used in life testing.

Lee, L. D.