Some methods of estimating a coverage parameter

Abstract

To demonstrate the high reliability of fault-tolerant computing systems, experimental testing can be performed by injecting faults into their hardware and observing the times needed to detect and isolate failed components and reconfigure the good components. Coverage, a parameter measuring continued system success, is the probability that recovery occurs before other, perhaps catastrophic, component failures occur. Methods of estimating coverage are given for the case of randomly selecting a subset of the pins or chips for testing. Pin-level samples of times to recovery are treated by the Type I censoring model often used in life testing.