DOE OSTI2016Using Ray Tracing Simulations for Direct Determination of Burgers Vectors of Threading Mixed Dislocations in 4H-SiC c-Plane Wafers Grown by PVT MethodAbstract not providedGuo, Jian Qiu↗
DOE OSTI2016Dislocation Characterization in 4H-SiC CrystalsAbstract not providedSumakeris, Joseph J.↗