DOE OSTI · 1328034
Dislocation Characterization in 4H-SiC Crystals
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Sumakeris, Joseph J., Leonard, R. T., Deyneka, Eugene, Khlebnikov, Yuri, Powell, Adrian R., Seaman, Jeff, Paisley, Michael J., Tsevtkov, V., Guo, Jian Qiu, Yang, Yu, Dudley, Michael, Balkas, Elif. 2016-11-04. Dislocation Characterization in 4H-SiC Crystals. https://doi.org/10.4028/www.scientific.net%2Fmsf.858.393
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