Method for detecting leaks in hermetically sealed containers Patent
Method for locating leaks in hermetically sealed containers
Engineering topics
Publications and source records attributed to Litant, I..
Method for locating leaks in hermetically sealed containers
High purity pinhole free films /parylene/ applicability as barrier coating to keep semiconductor surface free from moisture, ions and contaminants
Separation of semiconductor wafer into chips bounded by scribe lines
Electrically conductive plastics fabrication and applications limitations, discussing plastic matrix materials loaded with various conductive fillers
Halogen detector for leakage in hermetically sealed devices
Breaking of semiconductor single crystal wafer into chips
Method employing a pressure chamber is used for dicing semiconductor single-crystal wafers, containing integrated circuits, into small chips along pre-scribed lines. Uniform bending of the scribed wafer over the convex surface of a perforated hemisphere, breaks it cleanly into individual chips without damaging the circuits.