Engineering topics
Publications and source records attributed to Maki, G..
This viewgraph presentation provides information on radiation tests on encoders intended for a constellation of microsatellites. The encoders use CMOS Ultra-Low Power Radiation Tolerant (CULPRiT) technology. The presentation addresses power consumption, radiation dosage, and Single Event Upset (SEU).
Radiation test results and analyses are presented for ultra-low power Reed Solomon encoder circuits that are being considered for use on the Space Technology 5 (ST5) mission. The total ionizing dose tolerance is in excess of 100 krad(Si) and is due to the low supply voltage and the use of back-bias, which suppresses radiation-induced leakage currents in the n-channel devices. The circuits do not latch-up for ion LET values of at least 90 MeV-sq cm/mg. A hardened-by-design approach to SEU has achieved an upset threshold of about 20 MeV-sq cm/mg. The SEU rate expected for these circuits in the geosynchronous transfer orbit of ST5 is low.
N-Modular Redundancy (NMR) is one of the best known fault tolerance techniques. Replication of a module to achieve fault tolerance is in some ways analogous to the use of a repetition code where an information symbol is replicated as parity symbols in a codeword. Linear Error-Correcting Codes (ECC) use linear combinations of information symbols as parity symbols which are used to generate syndromes for error patterns. These observations indicate links between the theory of ECC and the use of hardware redundancy for fault tolerance. In this paper, we explore some of these links and show examples of NMR systems where identification of good and failed elements is accomplished in a manner similar to error correction using linear ECC's.
High throughput is an overriding factor dictating system performance. A configurable data processor is presented which can be modified to optimize performance for a wide class of problems. The new processor is specifically designed for arbitrary data path operations and can be dynamically reconfigured.
A new basic VLSI circuit element is presented that can be used to realize pulse mode asynchronous sequential circuits. A synthesis procedure is developed along with an unconventional state assignment procedure. Level input asynchronous sequential circuits can be realized by converting a regular flow table into a differential mode flow table, thereby allowing the new synthesis technique to be general. The new circuits tolerate 1-1 crossovers. This circuit also provides a means for state sequence detection and real time fault detection.
A VLSI architecture for synchronous sequential controllers is presented that has attractive qualities for producing reliable circuits. In these circuits, one hardware implementation can realize any flow table with a maximum of 2(exp n) internal states and m inputs. Also all design equations are identical. A real time fault detection means is presented along with a strategy for verifying the correctness of the checking hardware. This self check feature can be employed with no increase in hardware. The architecture can be modified to achieve fail safe designs. With no increase in hardware, an adaptable circuit can be realized that allows replacement of faulty transitions with fault free transitions.
Tracey's Theorem has long been recognized as essential in generating state assignments for asynchronous sequential circuits. This paper shows that Tracey's Theorem also has a significant impact in generating the design equations. Moreover, this theorem is important to the fundamental understanding of asynchronous sequential operation. The results of this work simplify asynchronous logic design. Moreover, detection of safe circuits is made easier.
A new class of asynchronous sequential circuits is introduced in this paper. The new design procedures are oriented towards producing asynchronous sequential circuits that are implemented with CMOS VLSI and take advantage of pass transistor technology. The first design algorithm utilizes a standard Single Transition Time (STT) state assignment. The second method introduces a new class of self synchronizing asynchronous circuits which eliminates the need for critical race free state assignments. These circuits arbitrate the transition path action by forcing the circuit to sequence through proper unstable states. These methods result in near minimum hardware since only the transition paths associated with state variable changes need to be implemented with pass transistor networks.
A major problem associated with state assignment procedures for VLSI controllers is obtaining an assignment that produces minimal or near minimal logic. The key item in Programmable Logic Array (PLA) area minimization is the number of unique product terms required by the design equations. This paper presents a state assignment algorithm for minimizing the number of product terms required to implement a finite state machine using a PLA. Partition algebra with predecessor state information is used to derive a near optimal state assignment. A maximum bound on the number of product terms required can be obtained by inspecting the predecessor state information. The state assignment algorithm presented is much simpler than existing procedures and leads to the same number of product terms or less. An area-efficient PLA structure implemented in a 1.0 micron CMOS process is presented along with a summary of the performance for a controller implemented using this design procedure.
This paper presents a programmable architecture for sequential pass transistor circuits. The resulting circuits are such that a state machine with N states and M output is constructed using a single layout replicated N + M times.
A simple straight-forward Karnaugh map logic design procedure for realization of multiple-valued logic circuits is presented in this paper. Pass transistor logic gates are used to realize multiple-valued networks. This work is an extension of pass transistor implementations for binary-valued logic.
A VLSI coder is presented that can function either as an encoder or decoder for Reed-Solomon codes. VLSI is one approach to implementing high-performance Reed-Solomon decoders. There are three VLSI technologies that could be used: gate arrays, standard cells, and full custom. The first two approaches are relatively easy to implement, but are limited in both performance and density. Full-custom VLSI is used to achieve both circuit density and speed, and allows control of the amount of interconnect. Speed, which is a function of capacitance, which is a function of interconnect, is an important parameter in high-performance VLSI. A single 8.2 mm x 8.4 mm, 200,000 transistor CMOS chip implementation of the Reed-Solomon code required by the Hubble Space Telescope is reported. The chip features a 10-MHz sustained byte rate independent of error pattern. The 1.6-micron CMOS integrated circuit has complete decoder and encoder functions and uses a single data/system clock. Block lengths up to 255 bytes and shortened codes are supported with no external buffering. Erasure corrections and random error corrections are supported with programmable correction of up to 10 symbol errors. Correction time is independent of error pattern and the number of errors in the incoming message.