Total Ionizing Dose Effects on Gallium Oxide MOSFETs
Poster showing TID data on AFRL Ga2O3 MOSFETs, the mechanisms behind the effects, and some simulations in TCAD
Cadena, Rick [Vanderbilt University]↗
Engineering topics
Neal, Adam [AFRL]
Publications and source records attributed to Neal, Adam [AFRL].
Total Ionizing Dose Effects on Gallium Oxide MOSFETs
This summary will be submitted for review for the 2025 HEART conference.
Smith, Michael Brandon [Sandia National Laboratori↗