Summary of Recent Total Ionizing Dose Testing on GF 12LP CMOS Technology.
Abstract not provided.
Barnaby, Hugh↗
Engineering topics
Neuendank, Jereme
Publications and source records attributed to Neuendank, Jereme.
Characterization of Total Ionixing Dose Effects in 12nm FinFET Technology with 60keV X-Rays.
Abstract not provided.
Spear, Matthew↗