DOE OSTI · 2006003
Summary of Recent Total Ionizing Dose Testing on GF 12LP CMOS Technology.
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Barnaby, Hugh, Wallace, Trace, Marinella, Matthew J, Neuendank, Jereme, Wilson, Donald, Massengill, Lloyd, Kauppila, Jeff, Poe, Grant. 2022-11-01. Summary of Recent Total Ionizing Dose Testing on GF 12LP CMOS Technology.. https://doi.org/10.2172/2006003
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