Summary of Recent Total Ionizing Dose Testing on GF 12LP CMOS Technology.
Abstract not provided.
Barnaby, Hugh↗
Engineering topics
Wallace, Trace
Publications and source records attributed to Wallace, Trace.
Layout Dependence of Total Ionizing Dose Effects on 12-nm Bulk FinFET Digital Structures .
Abstract not provided.
Wallace, Trace↗
Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits.
Abstract not provided.
Spear, Matthew↗
Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits.
Abstract not provided.
Spear, Matthew↗
Characterization of Total Ionixing Dose Effects in 12nm FinFET Technology with 60keV X-Rays.
Abstract not provided.
Spear, Matthew↗
Total ionizing dose and single event effects on 12-nm bulk FinFETs.
Abstract not provided.
Wilson, Donald↗