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Novak, Frank

Publications and source records attributed to Novak, Frank.

6 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS2006

Self-Adaptive System based on Field Programmable Gate Array for Extreme Temperature Electronics

In this work, we report the implementation of a self-adaptive system using a field programmable gate array (FPGA) and data converters. The self-adaptive system can autonomously recover the lost functionality of a reconfigurable analog array (RAA) integrated circuit (IC) [3]. Both the RAA IC and the self-adaptive system are operating in extreme temperatures (from 120 C down to -180 C). The RAA IC consists of reconfigurable analog blocks interconnected by several switches and programmable by bias voltages. It implements filters/amplifiers with bandwidth up to 20 MHz. The self-adaptive system controls the RAA IC and is realized on Commercial-Off-The-Shelf (COTS) parts. It implements a basic compensation algorithm that corrects a RAA IC in less than a few milliseconds. Experimental results for the cold temperature environment (down to -180 C) demonstrate the feasibility of this approach.

adaptive hardwares↗
NASA NTRS2006

Development of an Extra-vehicular (EVA) Infrared (IR) Camera Inspection System

Designed to fulfill a critical inspection need for the Space Shuttle Program, the EVA IR Camera System can detect crack and subsurface defects in the Reinforced Carbon-Carbon (RCC) sections of the Space Shuttle s Thermal Protection System (TPS). The EVA IR Camera performs this detection by taking advantage of the natural thermal gradients induced in the RCC by solar flux and thermal emission from the Earth. This instrument is a compact, low-mass, low-power solution (1.2cm3, 1.5kg, 5.0W) for TPS inspection that exceeds existing requirements for feature detection. Taking advantage of ground-based IR thermography techniques, the EVA IR Camera System provides the Space Shuttle program with a solution that can be accommodated by the existing inspection system. The EVA IR Camera System augments the visible and laser inspection systems and finds cracks and subsurface damage that is not measurable by the other sensors, and thus fills a critical gap in the Space Shuttle s inspection needs. This paper discusses the on-orbit RCC inspection measurement concept and requirements, and then presents a detailed description of the EVA IR Camera System design.

Gazarik, Michael↗
NASA NTRS2005

Infrared On-Orbit RCC Inspection With the EVA IR Camera: Development of Flight Hardware From a COTS System

In November 2004, NASA's Space Shuttle Program approved the development of the Extravehicular (EVA) Infrared (IR) Camera to test the application of infrared thermography to on-orbit reinforced carbon-carbon (RCC) damage detection. A multi-center team composed of members from NASA's Johnson Space Center (JSC), Langley Research Center (LaRC), and Goddard Space Flight Center (GSFC) was formed to develop the camera system and plan a flight test. The initial development schedule called for the delivery of the system in time to support STS-115 in late 2005. At the request of Shuttle Program managers and the flight crews, the team accelerated its schedule and delivered a certified EVA IR Camera system in time to support STS-114 in July 2005 as a contingency. The development of the camera system, led by LaRC, was based on the Commercial-Off-the-Shelf (COTS) FLIR S65 handheld infrared camera. An assessment of the S65 system in regards to space-flight operation was critical to the project. This paper discusses the space-flight assessment and describes the significant modifications required for EVA use by the astronaut crew. The on-orbit inspection technique will be demonstrated during the third EVA of STS-121 in September 2005 by imaging damaged RCC samples mounted in a box in the Shuttle's cargo bay.

Gazanik, Michael↗
NASA NTRS2004

A Chip and Pixel Qualification Methodology on Imaging Sensors

This paper presents a qualification methodology on imaging sensors. In addition to overall chip reliability characterization based on sensor s overall figure of merit, such as Dark Rate, Linearity, Dark Current Non-Uniformity, Fixed Pattern Noise and Photon Response Non-Uniformity, a simulation technique is proposed and used to project pixel reliability. The projected pixel reliability is directly related to imaging quality and provides additional sensor reliability information and performance control.

Chen, Yuan↗