NASA NTRS · 20040073471
A Chip and Pixel Qualification Methodology on Imaging Sensors
Abstract
This paper presents a qualification methodology on imaging sensors. In addition to overall chip reliability characterization based on sensor s overall figure of merit, such as Dark Rate, Linearity, Dark Current Non-Uniformity, Fixed Pattern Noise and Photon Response Non-Uniformity, a simulation technique is proposed and used to project pixel reliability. The projected pixel reliability is directly related to imaging quality and provides additional sensor reliability information and performance control.
Keep this discovery
Explore connections, maps & timelines
Chen, Yuan, Guertin, Steven M., Petkov, Mihail, Nguyen, Duc N., Novak, Frank. 2004-01-01. A Chip and Pixel Qualification Methodology on Imaging Sensors. https://ntrs.nasa.gov/citations/20040073471
Cite the original work for its findings. Save a collection to share your selection of sources.