EXAFS as a probe of actinide oxide formation in the tender X-ray regime
Recent developments in Resonant Inelastic X-Ray Scattering Experiments have vastly improved the resolution in X-ray Spectroscopies such as X-ray Absorption. However, the use of Tender X-rays (~3 keV) and the reactivity of actinides such as uranium have given rise to new questions about bulk and surface sensitivity, what constitutes a surface and how to characterize the formation of an oxide. It will be shown herein that the in situ electron scattering features that are part of the RIXS spectrum can be used to quantify the uranium oxide formation and determine cleanliness, independently of the near edge features that provide information about the unoccupied electronic density of states.