Engineering topics
Publications and source records attributed to O'Neill, Patrick M..
We present the results of Single Event Effects (SEE) testing with high energy protons and with low and high energy heavy ions for electrical components considered for Low Earth Orbit (LEO) and for deep space applications.
We present the results of Single Event Effects (SEE) testing with high energy protons and with low and high energy heavy ions for electrical components considered for Low Earth Orbit (LEO) and for deep space applications.
For the analysis of radiation risks to astronauts and planning exploratory space missions, accurate energy spectrum of galactic cosmic radiation (GCR) is necessary. Characterization of the ionizing radiation environment is challenging because the interplanetary plasma and radiation fields are modulated by solar disturbances and the radiation doses received by astronauts in interplanetary space are likewise influenced. A model of the Badhwar‐O'Neill 2011 (BO11) GCR environment, which is represented by GCR deceleration potential theta, has been derived by utilizing all of the GCR measurements from balloons, satellites, and the newer NASA Advanced Composition Explorer (ACE). In the BO11 model, the solar modulation level is derived from the mean international sunspot numbers with time‐delay, which has been calibrated with actual flight instrument measurements to produce better GCR flux data fit during solar minima. GCR fluxes provided by the BO11 model were compared with various spacecraft measurements at 1 AU, and further comparisons were made for the tissue equivalent proportional counters measurements at low Earth orbits using the high‐charge and energy transport (HZETRN) code and various GCR models. For the comparison of the absorbed dose and dose equivalent calculations with the measurements by Radiation Assessment Detector (RAD) at Gale crater on Mars, the intensities and energies of GCR entering the heliosphere were calculated by using the BO11 model, which accounts for time‐dependent attenuation of the local interstellar spectrum of each element. The BO11 model, which has emphasized for the last 24 solar minima, showed in relatively good agreement with the RAD data for the first 200 sols, but it was resulted in to be less well during near the solar maximum of solar cycle 24 due to subtleties in the changing heliospheric conditions. By performing the error analysis of the BO11 model and the optimization in reducing overall uncertainty, the resultant BO13 model corrects the fit at solar maxima as well as being accurate at solar minima. The BO13 model is implemented to the NASA Space Cancer Risk model for the assessment of radiation risks. Overall cumulative probability distribution of solar modulation parameters represents the percentile rank of the average interplanetary GCR environment, and the probabilistic radiation risks can be assessed for various levels of GCR environment to support mission design and operational planning for future manned space exploration missions.
Review of models of the near-Earth space radiation environment is presented, including recent developments in trapped proton and electron, galactic cosmic ray and solar particle event models geared toward spacecraft electronics applications.
The Proton Upset Monte Carlo Simulation (PROPSET) program calculates the frequency of on-orbit upsets in computer chips (for given orbits such as Low Earth Orbit, Lunar Orbit, and the like) from proton bombardment based on the results of heavy ion testing alone. The software simulates the bombardment of modern microelectronic components (computer chips) with high-energy (.200 MeV) protons. The nuclear interaction of the proton with the silicon of the chip is modeled and nuclear fragments from this interaction are tracked using Monte Carlo techniques to produce statistically accurate predictions.
This paper describes new software simulation code for predicting single event upset data from measured heavy ion data, using methods, code, and algorithms already reported in the open literature. The measured data that is used to compare against the results of this new simulation code has also been reported in the open literature (R. Koga, et al). The new code is not provided as part of this paper, only the methodology used in generating the code. This paper presents results of basic research, not design-to information, and is representative of other papers reported in the open literature (see paper references). Therefore, the content of this paper is suitable for being made publicly available at the IEEE conference and the resulting IEEE journal.
Design options for decreasing the susceptibility of integrated circuits to Single Event Upset (SEU) fall into two categories: (1) increasing the critical charge to cause an upset at a particular node, and (2) employing redundancy to mask or correct errors. With decreasing device sizes on an Integrated Circuit (IC), the amount of charge required to represent a logic state has steadily reduced. Critical charge methods such as increasing drive strength or increasing the time required to change state as in capacitive or resistive hardening or delay based approaches extract a steadily increasing penalty as a percentage of device resources and performance. Dual redundancy is commonly assumed only to provide error detection with Triple Modular Redundancy (TMR) required for correction, but less well known methods employ dual redundancy to achieve full error correction by voting two inputs with a prior state to resolve ambiguity. This requires special circuits such as the Whitaker latch [1], or the guard-gate [2] which some of us have called a Transition AND Gate (TAG) [3]. A 2-input guard gate is shown in Figure 1. It is similar to a Muller Completion Element [4] and relies on capacitance at node "out" to retain the prior state when inputs disagree, while eliminating any output buffer which would be susceptible to radiation strikes. This paper experimentally compares delay based and dual rail flip-flop designs wherein both types of circuits employ guard-gates to optimize layout and performance, and draws conclusions about design criteria and suitability of each option. In both cases a design goal is protection against Single Event Transients (SET) in combinational logic as well as SEU in the storage elements. For the delay based design, it is also a goal to allow asynchronous clear or preset inputs on the storage elements, which are often not available in radiation tolerant designs.
We describe heavy ion test results for two new SEU tolerant latches based on transition nand gates, one for single rail asynchronous and the other for dual rail synchronous designs, implemented in AMI 0.5microprocess.
The direct ionization Linear Energy Transfer (LET) for 200 MeV protons in silicon is much smaller than that for higher charged particles since LET increases as the square of the ion charge. However, occasionally the proton interacts with the silicon nuclei and produces a shower of fragments and a recoiling nucleus. When this happens, the LET produced is much greater than the direct ionization LET. Testing the single event effect susceptibility of components using energetic (200 MeV) protons is often the only viable option for system level testing commercial-off-the-shelf (COTS) avionics that have not been designed for space environments. However, the question of how a system tested with protons will perform in a heavy ion environment arises. Here the concern is not only with prediction of on-orbit upset rate, but also about possibility of on-orbit failures that were not observed during proton testing.
Particle detectors (DOSTEL, CPDS, and TEPC) measure the energy deposition spectrum inside earth orbiting - manned spacecraft (shuttle, space station). These instruments attempt to emulate the deposition of energy in human tissue to evaluate the health risk. However, the measurements are often difficult to relate to tissue equivalent because nuclear fragmentation (internuclear cascade/evaporation), energy-loss straggling, heavy ions, spacecraft shielding and detector geometry/orientation, and coincidence thresholds significantly affect the measured spectrum. 'A le have developed a high fidelity Monte Carlo model addressing each of these effects that significantly improves interpretation of these instruments and the resulting assessment of radiation risk to humans.