NASA NTRS1977
Mathematical models which quantify the relation of wheat yield to selected weather-related variables are presented. Other sources of variation (amount of applied nitrogen, improved varieties, cultural practices) have been incorporated in the models to explain yield variation both singly and in combination with weather-related variables. Separate models were developed for fall-planted (winter) and spring-planted (spring) wheats. Meteorological variation is observed, basically, by daily measurements of minimum and maximum temperatures, precipitation, and tabled values of solar radiation at the edge of the atmosphere and daylength. Two different soil moisture budgets are suggested to compute simulated values of evapotranspiration; one uses the above-mentioned inputs, the other uses the measured temperatures and precipitation but replaces the tabled values (solar radiation and daylength) by measured solar radiation and satellite-derived multispectral scanner data to estimate leaf area index. Weather-related variables are defined by phenological stages, rather than calendar periods, to make the models more universally applicable.