A universal model for estimating wheat yields

Abstract

A universal wheat yield model applicable to both fall- and spring-planted wheat was developed to show separate and joint effects of weather and culture on yields. Data from state experiment stations in a wide range of climates in the U.S. Great Plains were used to build basic relationships among yields, weather, and culture. The application of the model on a macroclimatic scale in the U.S., the U.S.S.R., and India is discussed along with potential improvements.